Fachinformationsdienst BAUdigital

A platform for research: civil engineering, architecture and urbanism

    Lattice distortion near InGaP compound semiconductor surface due to surface treatment of bias sputtering

    New search for: Emoto, T.
    New search for: Yoshida, Y.
    New search for: Akimoto, K.
    New search for: Ichimiya, A.
    New search for: Kikuchi, S.
    New search for: Itagaki, K.
    New search for: Namita, H.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Lattice distortion near InGaP compound semiconductor surface due to surface treatment of bias sputtering

    New search for: Emoto, T.
    New search for: Yoshida, Y.
    New search for: Akimoto, K.
    New search for: Ichimiya, A.
    New search for: Kikuchi, S.
    New search for: Itagaki, K.
    New search for: Namita, H.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Lattice distortion near InGaP compound semiconductor surface due to surface treatment of bias sputtering

    New search for: Emoto, T.
    New search for: Yoshida, Y.
    New search for: Akimoto, K.
    New search for: Ichimiya, A.
    New search for: Kikuchi, S.
    New search for: Itagaki, K.
    New search for: Namita, H.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Lattice distortion near InGaP compound semiconductor surface due to surface treatment of bias sputtering

    Contributors:

    Emoto, T. (author) / Yoshida, Y. (author) / Akimoto, K. (author) / Ichimiya, A. (author) / Kikuchi, S. (author) / Itagaki, K. (author) / Namita, H. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 216 ; 83-87

    Publication date:

    2003-01-01

    Size:

    5 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

    Similar titles

    Lattice distortion due to surface treatment of bias sputtering revealed by extremely asymmetric X-ray diffraction

    Yoshida, Y. / Akimoto, K. / Emoto, T. et al. | British Library Online Contents | 2004

    A Near Surface Defect-Induced Lattice Distortion

    Kapelewski, J. | British Library Online Contents | 1993

    Anisotropic surface structure in ordered strained InGaP

    Hasenohrl, S. / Kudela, R. / Novak, J. et al. | British Library Online Contents | 2002

    OMVPE of InAs quantum dots on an InGaP surface

    Forbes, D. V. / Podell, A. M. / Slocum, M. A. et al. | British Library Online Contents | 2013

    Photoluminescence characterization of InGaP/GaAs/InGaP quantum wires

    Kicin, S. / Novak, J. / Hasenohrl, S. et al. | British Library Online Contents | 2001

    Back to top