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Sulphur-Passivated GaAs Investigation Using High Resolution X-Ray Diffractometry

Pavlov, K. / Jamieson, I. / Jakovidis, G. / Petrakov, A. / Punegov, V.

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Sulphur-Passivated GaAs Investigation Using High Resolution X-Ray Diffractometry

Pavlov, K. / Jamieson, I. / Jakovidis, G. / Petrakov, A. / Punegov, V.

Sulphur-Passivated GaAs Investigation Using High Resolution X-Ray Diffractometry

Pavlov, K. / Jamieson, I. / Jakovidis, G. / Petrakov, A. / Punegov, V.

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Check availability in my library

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Document information

Title:

Sulphur-Passivated GaAs Investigation Using High Resolution X-Ray Diffractometry

Contributors:

Pavlov, K. (author) / Jamieson, I. (author) / Jakovidis, G. (author) / Petrakov, A. (author) / Punegov, V. (author)

Published in:

SURFACE REVIEW AND LETTERS ; 10 ; 533-536

Publication date:

2003-01-01

Size:

4 pages

ISSN:

0218-625X

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 530.417

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