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High-Accuracy Lattice Constant Measurements of Electron-Irradiated 6H-SiC Single Crystals
High-Accuracy Lattice Constant Measurements of Electron-Irradiated 6H-SiC Single Crystals
High-Accuracy Lattice Constant Measurements of Electron-Irradiated 6H-SiC Single Crystals
Seitz, C. (author) / Rempel, A. A. (author) / Magerl, A. (author) / Gomm, M. (author) / Sprengel, W. (author) / Schaefer, H.-E. (author) / Bergman, P. / Janzen, E.
2003-01-01
4 pages
Article (Journal)
English
DDC:
620.11
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