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    Polytype-Dependent Vacancy Annealing Studied by Positron Annihilation

    New search for: Kawasuso, A.
    New search for: Yoshikawa, M.
    New search for: Maekawa, M.
    New search for: Itoh, H.
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    Polytype-Dependent Vacancy Annealing Studied by Positron Annihilation

    New search for: Kawasuso, A.
    New search for: Yoshikawa, M.
    New search for: Maekawa, M.
    New search for: Itoh, H.
    New search for: Chiba, T.
    New search for: Redmann, F.
    New search for: Krause-Rehberg, R.
    New search for: Weidner, M.
    New search for: Frank, T.
    New search for: Pensl, G.
    New search for: Bergman, P.
    New search for: Janzen, E.

    Access

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    Check availability in my library
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    Polytype-Dependent Vacancy Annealing Studied by Positron Annihilation

    New search for: Kawasuso, A.
    New search for: Yoshikawa, M.
    New search for: Maekawa, M.
    New search for: Itoh, H.
    New search for: Chiba, T.
    New search for: Redmann, F.
    New search for: Krause-Rehberg, R.
    New search for: Weidner, M.
    New search for: Frank, T.
    New search for: Pensl, G.
    New search for: Bergman, P.
    New search for: Janzen, E.

    Access

    Access via TIB
    Check availability in my library
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    Document information
    Title:

    Polytype-Dependent Vacancy Annealing Studied by Positron Annihilation

    Contributors:

    Kawasuso, A. (author) / Yoshikawa, M. (author) / Maekawa, M. (author) / Itoh, H. (author) / Chiba, T. (author) / Redmann, F. (author) / Krause-Rehberg, R. (author) / Weidner, M. (author) / Frank, T. (author) / Pensl, G. (author)

    Published in:

    Silicon Carbide and Related Materials 2002 ; 477-480

    MATERIALS SCIENCE FORUM ; 433/436

    Publication date:

    2003-01-01

    Size:

    4 pages

    ISSN:

    0255-5476

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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