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    EPR Study of Electron Irradiation-Induced Defects in Semi-Insulating SiC:V

    New search for: von Bardeleben, H. J.
    New search for: Cantin, J. L.
    New search for: Reshanov, S. A.
    New search for: Rastegaev, V. P.
    New search for: Bergman, P.
    New search for: Janzen, E.

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    EPR Study of Electron Irradiation-Induced Defects in Semi-Insulating SiC:V

    New search for: von Bardeleben, H. J.
    New search for: Cantin, J. L.
    New search for: Reshanov, S. A.
    New search for: Rastegaev, V. P.
    New search for: Bergman, P.
    New search for: Janzen, E.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    EPR Study of Electron Irradiation-Induced Defects in Semi-Insulating SiC:V

    New search for: von Bardeleben, H. J.
    New search for: Cantin, J. L.
    New search for: Reshanov, S. A.
    New search for: Rastegaev, V. P.
    New search for: Bergman, P.
    New search for: Janzen, E.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

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    Document information
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    Document information
    Title:

    EPR Study of Electron Irradiation-Induced Defects in Semi-Insulating SiC:V

    Contributors:

    von Bardeleben, H. J. (author) / Cantin, J. L. (author) / Reshanov, S. A. (author) / Rastegaev, V. P. (author) / Bergman, P. / Janzen, E.

    Published in:

    Silicon Carbide and Related Materials 2002 ; 507-510

    MATERIALS SCIENCE FORUM ; 433/436

    Publication date:

    2003-01-01

    Size:

    4 pages

    ISSN:

    0255-5476

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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