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Infrared analysis of thin layers by attenuated total reflection spectroscopy
Infrared analysis of thin layers by attenuated total reflection spectroscopy
Infrared analysis of thin layers by attenuated total reflection spectroscopy
Rochat, N. (author) / Chabli, A. (author) / Bertin, F. (author) / Vergnaud, C. (author) / Mur, P. (author) / Petitdidier, S. (author) / Besson, P. (author)
MATERIALS SCIENCE AND ENGINEERING B -LAUSANNE- ; 102 ; 16-21
2003-01-01
6 pages
Article (Journal)
English
DDC:
620.11
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