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Polytype determination at the SiC-SiO2 interface by internal electron photoemission scattering spectroscopy

Afanas'ev, V. V. / Stesmans, A.

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Polytype determination at the SiC-SiO2 interface by internal electron photoemission scattering spectroscopy

Afanas'ev, V. V. / Stesmans, A.

Polytype determination at the SiC-SiO2 interface by internal electron photoemission scattering spectroscopy

Afanas'ev, V. V. / Stesmans, A.

Access

Access via TIB

Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

Polytype determination at the SiC-SiO2 interface by internal electron photoemission scattering spectroscopy

Contributors:

Afanas'ev, V. V. (author) / Stesmans, A. (author)

Published in:

MATERIALS SCIENCE AND ENGINEERING B -LAUSANNE- ; 102 ; 308-312

Publication date:

2003-01-01

Size:

5 pages

ISSN:

0921-5107

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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