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    Characterization of Si(111) crystals implanted with Sb+ ions and annealed by rapid thermal processing

    New search for: Labbani, R.
    New search for: Halimi, R.
    New search for: Laoui, T.
    New search for: Vantomme, A.
    New search for: Pipeleers, B.
    New search for: Roebben, G.

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    Characterization of Si(111) crystals implanted with Sb+ ions and annealed by rapid thermal processing

    New search for: Labbani, R.
    New search for: Halimi, R.
    New search for: Laoui, T.
    New search for: Vantomme, A.
    New search for: Pipeleers, B.
    New search for: Roebben, G.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Characterization of Si(111) crystals implanted with Sb+ ions and annealed by rapid thermal processing

    New search for: Labbani, R.
    New search for: Halimi, R.
    New search for: Laoui, T.
    New search for: Vantomme, A.
    New search for: Pipeleers, B.
    New search for: Roebben, G.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Characterization of Si(111) crystals implanted with Sb+ ions and annealed by rapid thermal processing

    Contributors:

    Labbani, R. (author) / Halimi, R. (author) / Laoui, T. (author) / Vantomme, A. (author) / Pipeleers, B. (author) / Roebben, G. (author)

    Published in:

    MATERIALS SCIENCE AND ENGINEERING B -LAUSANNE- ; 102 ; 390-397

    Publication date:

    2003-01-01

    Size:

    8 pages

    ISSN:

    0921-5107

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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