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    Interface characteristics affecting electrical properties of Y-doped SiC

    New search for: Siegelin, F.
    New search for: Kleebe, H.-J.
    New search for: Sigl, L. S.

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    Interface characteristics affecting electrical properties of Y-doped SiC

    New search for: Siegelin, F.
    New search for: Kleebe, H.-J.
    New search for: Sigl, L. S.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Interface characteristics affecting electrical properties of Y-doped SiC

    New search for: Siegelin, F.
    New search for: Kleebe, H.-J.
    New search for: Sigl, L. S.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

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    Document information
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    Document information
    Title:

    Interface characteristics affecting electrical properties of Y-doped SiC

    Contributors:

    Siegelin, F. (author) / Kleebe, H.-J. (author) / Sigl, L. S. (author)

    Published in:

    JOURNAL OF MATERIALS RESEARCH -PITTSBURGH THEN WARRENDALE- ; 18 ; 2608-2617

    Publication date:

    2003-01-01

    Size:

    10 pages

    ISSN:

    0884-2914

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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