FTIR and XPS investigation of Er-doped SiO2-TiO2 films: Fid-Bau Portal

FTIR and XPS investigation of Er-doped SiO2-TiO2 films

Fang, Q. / Meier, M. / Yu, J. J. / Wang, Z. M. / Zhang, J. Y. / Wu, J. X. / Kenyon, A. / Hoffmann, P. / Boyd, I. W.

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FTIR and XPS investigation of Er-doped SiO2-TiO2 films

Fang, Q. / Meier, M. / Yu, J. J. / Wang, Z. M. / Zhang, J. Y. / Wu, J. X. / Kenyon, A. / Hoffmann, P. / Boyd, I. W.

FTIR and XPS investigation of Er-doped SiO2-TiO2 films

Fang, Q. / Meier, M. / Yu, J. J. / Wang, Z. M. / Zhang, J. Y. / Wu, J. X. / Kenyon, A. / Hoffmann, P. / Boyd, I. W.

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Document information

Title:

FTIR and XPS investigation of Er-doped SiO2-TiO2 films

Contributors:

Fang, Q. (author) / Meier, M. (author) / Yu, J. J. (author) / Wang, Z. M. (author) / Zhang, J. Y. (author) / Wu, J. X. (author) / Kenyon, A. (author) / Hoffmann, P. (author) / Boyd, I. W. (author)

Published in:

MATERIALS SCIENCE AND ENGINEERING B -LAUSANNE- ; 105 ; 208-212

Publication date:

2003-01-01

Size:

5 pages

ISSN:

0921-5107

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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