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    X-Ray Inspection: Evolution from Microfocus to Nanofocus

    New search for: Daneke, N.
    New search for: Schanklies, B.

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    X-Ray Inspection: Evolution from Microfocus to Nanofocus

    New search for: Daneke, N.
    New search for: Schanklies, B.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    X-Ray Inspection: Evolution from Microfocus to Nanofocus

    New search for: Daneke, N.
    New search for: Schanklies, B.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    X-Ray Inspection: Evolution from Microfocus to Nanofocus

    Contributors:

    Daneke, N. (author) / Schanklies, B. (author)

    Published in:

    ADVANCED PACKAGING ; 12 ; 17-20

    Publication date:

    2003-01-01

    Size:

    4 pages

    ISSN:

    1065-0555

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  658.564

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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