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Nanocrystalline Si Studied by Beam-Based Positron Annihilation Spectroscopy

Coleman, P. G. / Pi, X. D. / Gwilliam, R. M. / Sealy, B. J.

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Nanocrystalline Si Studied by Beam-Based Positron Annihilation Spectroscopy

Coleman, P. G. / Pi, X. D. / Gwilliam, R. M. / Sealy, B. J.

Nanocrystalline Si Studied by Beam-Based Positron Annihilation Spectroscopy

Coleman, P. G. / Pi, X. D. / Gwilliam, R. M. / Sealy, B. J.

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Document information

Title:

Nanocrystalline Si Studied by Beam-Based Positron Annihilation Spectroscopy

Contributors:

Coleman, P. G. (author) / Pi, X. D. (author) / Gwilliam, R. M. (author) / Sealy, B. J. (author)

Published in:

MATERIALS SCIENCE FORUM ; 445/446 ; 66-68

Publication date:

2004-01-01

Size:

3 pages

ISSN:

0255-5476

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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