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Characterisation of Defects in Simulated Nanostructures

Van Petegem, S. / Kuriplach, J. / Van Swygenhoven, H. / Meyer, R. / Dauwe, C. / Segers, D.

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Characterisation of Defects in Simulated Nanostructures

Van Petegem, S. / Kuriplach, J. / Van Swygenhoven, H. / Meyer, R. / Dauwe, C. / Segers, D.

Characterisation of Defects in Simulated Nanostructures

Van Petegem, S. / Kuriplach, J. / Van Swygenhoven, H. / Meyer, R. / Dauwe, C. / Segers, D.

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Check availability in my library

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Document information

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Document information

Title:

Characterisation of Defects in Simulated Nanostructures

Contributors:

Van Petegem, S. (author) / Kuriplach, J. (author) / Van Swygenhoven, H. (author) / Meyer, R. (author) / Dauwe, C. (author) / Segers, D. (author)

Published in:

MATERIALS SCIENCE FORUM ; 445/446 ; 204-206

Publication date:

2004-01-01

Size:

3 pages

ISSN:

0255-5476

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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