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Non-Destructive Lifetime Prediction in Material Testing with the Bonn Positron Microprobe
Non-Destructive Lifetime Prediction in Material Testing with the Bonn Positron Microprobe
Non-Destructive Lifetime Prediction in Material Testing with the Bonn Positron Microprobe
Muller, I. (author) / Bennewitz, K. (author) / Haaks, M. (author) / Staab, T. E. M. (author) / Eisenberg, S. (author) / Lampe, T. (author) / Maier, K. (author)
MATERIALS SCIENCE FORUM ; 445/446 ; 498-500
2004-01-01
3 pages
Article (Journal)
English
DDC:
620.11
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