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    Spatially Resolved Detection of Point Defects in the Vicinity of Scratches on GaAs by the Bonn Positron Microprobe

    New search for: Staab, T. E. M.
    New search for: Zamponi, C.
    New search for: Haaks, M.
    New search for: Muller, I.
    New search for: Eichler, S.
    New search for: Maier, K.

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    Spatially Resolved Detection of Point Defects in the Vicinity of Scratches on GaAs by the Bonn Positron Microprobe

    New search for: Staab, T. E. M.
    New search for: Zamponi, C.
    New search for: Haaks, M.
    New search for: Muller, I.
    New search for: Eichler, S.
    New search for: Maier, K.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Spatially Resolved Detection of Point Defects in the Vicinity of Scratches on GaAs by the Bonn Positron Microprobe

    New search for: Staab, T. E. M.
    New search for: Zamponi, C.
    New search for: Haaks, M.
    New search for: Muller, I.
    New search for: Eichler, S.
    New search for: Maier, K.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

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    Document information
    Title:

    Spatially Resolved Detection of Point Defects in the Vicinity of Scratches on GaAs by the Bonn Positron Microprobe

    Contributors:

    Staab, T. E. M. (author) / Zamponi, C. (author) / Haaks, M. (author) / Muller, I. (author) / Eichler, S. (author) / Maier, K. (author)

    Published in:

    MATERIALS SCIENCE FORUM ; 445/446 ; 510-512

    Publication date:

    2004-01-01

    Size:

    3 pages

    ISSN:

    0255-5476

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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