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TEM observations of microscopic inclusions in synthetic diamond

Langenhorst, F. / Poirier, J. P. / Frost, D. J.

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TEM observations of microscopic inclusions in synthetic diamond

Langenhorst, F. / Poirier, J. P. / Frost, D. J.

TEM observations of microscopic inclusions in synthetic diamond

Langenhorst, F. / Poirier, J. P. / Frost, D. J.

Access

Access via TIB

Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

TEM observations of microscopic inclusions in synthetic diamond

Contributors:

Langenhorst, F. (author) / Poirier, J. P. (author) / Frost, D. J. (author)

Published in:

JOURNAL OF MATERIALS SCIENCE ; 39 ; 1865-1867

Publication date:

2004-01-01

Size:

3 pages

ISSN:

0022-2461

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

Yin, L. W. / Li, M. S. / Sun, D. S. et al. | British Library Online Contents | 2001

Characteristics of some inclusions contained in synthetic diamond single crystals

Yin, L. W. / Zou, Z. D. / Li, M. S. et al. | British Library Online Contents | 2000

Synthetic Diamond Separation

Kremen'kova, N. V. / Shukevich, A. K. | British Library Online Contents | 1999

Microscopic observations on silica bricks

Schouten, C. | Engineering Index Backfile | 1951

An electron microscopic study of nickel sulfide inclusions in toughened glass

Barry, J. C. / Ford, S. | British Library Online Contents | 2001