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Optical properties of stacked Ge/Si quantum dots with different spacer thickness grown by chemical vapor deposition

Chen, W. Y. / Chang, W. H. / Chou, A. T. / Hsu, T. M. / Chen, P. S. / Pei, Z. / Lai, L. S.

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Optical properties of stacked Ge/Si quantum dots with different spacer thickness grown by chemical vapor deposition

Chen, W. Y. / Chang, W. H. / Chou, A. T. / Hsu, T. M. / Chen, P. S. / Pei, Z. / Lai, L. S.

Optical properties of stacked Ge/Si quantum dots with different spacer thickness grown by chemical vapor deposition

Chen, W. Y. / Chang, W. H. / Chou, A. T. / Hsu, T. M. / Chen, P. S. / Pei, Z. / Lai, L. S.

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Document information

Title:

Optical properties of stacked Ge/Si quantum dots with different spacer thickness grown by chemical vapor deposition

Contributors:

Chen, W. Y. (author) / Chang, W. H. (author) / Chou, A. T. (author) / Hsu, T. M. (author) / Chen, P. S. (author) / Pei, Z. (author) / Lai, L. S. (author)

Published in:

APPLIED SURFACE SCIENCE ; 224 ; 148-151

Publication date:

2004-01-01

Size:

4 pages

ISSN:

0169-4332

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 621.35

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