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Characterization of grain alignment in Si3N4(w)/Si3N4 composites

Zou, L. / Park, D. S. / Cho, B. U. / Huang, Y. / Kim, H. D.

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Characterization of grain alignment in Si3N4(w)/Si3N4 composites

Zou, L. / Park, D. S. / Cho, B. U. / Huang, Y. / Kim, H. D.

Characterization of grain alignment in Si3N4(w)/Si3N4 composites

Zou, L. / Park, D. S. / Cho, B. U. / Huang, Y. / Kim, H. D.

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Order at Subito €

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Document information

Title:

Characterization of grain alignment in Si3N4(w)/Si3N4 composites

Contributors:

Zou, L. (author) / Park, D. S. (author) / Cho, B. U. (author) / Huang, Y. (author) / Kim, H. D. (author)

Published in:

MATERIALS LETTERS ; 58 ; 1587-1592

Publication date:

2004-01-01

Size:

6 pages

ISSN:

0167-577X

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.1105 / 530

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