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    Microstructural characterization of electroconductive Si3N4-TiN composites

    New search for: Lee, B. T.
    New search for: Yoon, Y. J.
    New search for: Lee, K. H.

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    Microstructural characterization of electroconductive Si3N4-TiN composites

    New search for: Lee, B. T.
    New search for: Yoon, Y. J.
    New search for: Lee, K. H.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Microstructural characterization of electroconductive Si3N4-TiN composites

    New search for: Lee, B. T.
    New search for: Yoon, Y. J.
    New search for: Lee, K. H.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

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    Check availability in my library
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    Document information
    Similar titles

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    Document information
    Title:

    Microstructural characterization of electroconductive Si3N4-TiN composites

    Contributors:

    Lee, B. T. (author) / Yoon, Y. J. (author) / Lee, K. H. (author)

    Published in:

    MATERIALS LETTERS ; 47 ; 71-76

    Publication date:

    2001-01-01

    Size:

    6 pages

    ISSN:

    0167-577X

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.1105 / 530

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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