Electron-diffraction and spectroscopical characterisation of ultrathin ZnS films grown by molecular beam epitaxy on GaP(0 0 1): Fid-Bau Portal

Electron-diffraction and spectroscopical characterisation of ultrathin ZnS films grown by molecular beam epitaxy on GaP(0 0 1)

Zhang, L. / Szargan, R. / Chasse, T.

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Electron-diffraction and spectroscopical characterisation of ultrathin ZnS films grown by molecular beam epitaxy on GaP(0 0 1)

Zhang, L. / Szargan, R. / Chasse, T.

Electron-diffraction and spectroscopical characterisation of ultrathin ZnS films grown by molecular beam epitaxy on GaP(0 0 1)

Zhang, L. / Szargan, R. / Chasse, T.

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Document information

Title:

Electron-diffraction and spectroscopical characterisation of ultrathin ZnS films grown by molecular beam epitaxy on GaP(0 0 1)

Contributors:

Zhang, L. (author) / Szargan, R. (author) / Chasse, T. (author)

Published in:

APPLIED SURFACE SCIENCE ; 227 ; 261-267

Publication date:

2004-01-01

Size:

7 pages

ISSN:

0169-4332

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 621.35

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