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Transmission electron microscopy and high-resolution transmission electron microscopy study of nanostructure and metastable phase Evolution in pulsed-laser-ablation-deposited Ti-Si thin film
Transmission electron microscopy and high-resolution transmission electron microscopy study of nanostructure and metastable phase Evolution in pulsed-laser-ablation-deposited Ti-Si thin film
Transmission electron microscopy and high-resolution transmission electron microscopy study of nanostructure and metastable phase Evolution in pulsed-laser-ablation-deposited Ti-Si thin film
Bysakh, S. (author) / Mitsuishi, K. (author) / Song, M. (author) / Furuya, K. (author) / Chattopadhyay, K. (author)
JOURNAL OF MATERIALS RESEARCH -PITTSBURGH THEN WARRENDALE- ; 19 ; 1118-1125
2004-01-01
8 pages
Article (Journal)
English
DDC:
620.11
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