X-ray, optical and electrical characterization of doped nanocrystalline titanium oxide thin films: Fid-Bau Portal

X-ray, optical and electrical characterization of doped nanocrystalline titanium oxide thin films

Domaradzki, J. / Prociow, E. L. / Kaczmarek, D. / Berlicki, T. / Podhorodecki, A. / Kudrawiec, R. / Misiewicz, J.

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X-ray, optical and electrical characterization of doped nanocrystalline titanium oxide thin films

Domaradzki, J. / Prociow, E. L. / Kaczmarek, D. / Berlicki, T. / Podhorodecki, A. / Kudrawiec, R. / Misiewicz, J.

X-ray, optical and electrical characterization of doped nanocrystalline titanium oxide thin films

Domaradzki, J. / Prociow, E. L. / Kaczmarek, D. / Berlicki, T. / Podhorodecki, A. / Kudrawiec, R. / Misiewicz, J.

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Document information

Title:

X-ray, optical and electrical characterization of doped nanocrystalline titanium oxide thin films

Contributors:

Domaradzki, J. (author) / Prociow, E. L. (author) / Kaczmarek, D. (author) / Berlicki, T. (author) / Podhorodecki, A. (author) / Kudrawiec, R. (author) / Misiewicz, J. (author)

Published in:

MATERIALS SCIENCE AND ENGINEERING B -LAUSANNE- ; 109 ; 249-251

Publication date:

2004-01-01

Size:

3 pages

ISSN:

0921-5107

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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