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    In Situ GIXRD Characterization of the Crystallization of Ni-Ti Sputtered Thin Films

    New search for: Martins, R. M. S.
    New search for: Silva, R. J. C.
    New search for: Fernandes, F. M. B.
    New search for: Pereira, L.
    New search for: Gordo, P. R.
    New search for: Maneira, M. J. P.
    New search for: Schell, N.

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    In Situ GIXRD Characterization of the Crystallization of Ni-Ti Sputtered Thin Films

    New search for: Martins, R. M. S.
    New search for: Silva, R. J. C.
    New search for: Fernandes, F. M. B.
    New search for: Pereira, L.
    New search for: Gordo, P. R.
    New search for: Maneira, M. J. P.
    New search for: Schell, N.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    In Situ GIXRD Characterization of the Crystallization of Ni-Ti Sputtered Thin Films

    New search for: Martins, R. M. S.
    New search for: Silva, R. J. C.
    New search for: Fernandes, F. M. B.
    New search for: Pereira, L.
    New search for: Gordo, P. R.
    New search for: Maneira, M. J. P.
    New search for: Schell, N.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

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    Document information
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    Document information
    Title:

    In Situ GIXRD Characterization of the Crystallization of Ni-Ti Sputtered Thin Films

    Contributors:

    Martins, R. M. S. (author) / Silva, R. J. C. (author) / Fernandes, F. M. B. (author) / Pereira, L. (author) / Gordo, P. R. (author) / Maneira, M. J. P. (author) / Schell, N. (author)

    Published in:

    MATERIALS SCIENCE FORUM ; 455/456 ; 342-345

    Publication date:

    2004-01-01

    Size:

    4 pages

    ISSN:

    0255-5476

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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