Structural characterization of ultrathin Cr and Sc films for soft X-ray mirrors: Fid-Bau Portal

Structural characterization of ultrathin Cr and Sc films for soft X-ray mirrors

Gorelik, T. / Kaiser, U. / Kuhlmann, T. / Yulin, S. / Richter, W.

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Structural characterization of ultrathin Cr and Sc films for soft X-ray mirrors

Gorelik, T. / Kaiser, U. / Kuhlmann, T. / Yulin, S. / Richter, W.

Structural characterization of ultrathin Cr and Sc films for soft X-ray mirrors

Gorelik, T. / Kaiser, U. / Kuhlmann, T. / Yulin, S. / Richter, W.

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Order at Subito €

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Document information

Title:

Structural characterization of ultrathin Cr and Sc films for soft X-ray mirrors

Contributors:

Gorelik, T. (author) / Kaiser, U. (author) / Kuhlmann, T. (author) / Yulin, S. (author) / Richter, W. (author)

Published in:

APPLIED SURFACE SCIENCE ; 230 ; 1-7

Publication date:

2004-01-01

Size:

7 pages

ISSN:

0169-4332

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 621.35

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