A platform for research: civil engineering, architecture and urbanism
A platform for research: civil engineering, architecture and urbanism
Effect of backscattered electrons on the analysis area in scanning Auger microscopy
Effect of backscattered electrons on the analysis area in scanning Auger microscopy
Effect of backscattered electrons on the analysis area in scanning Auger microscopy
Powell, C. J. (author)
APPLIED SURFACE SCIENCE ; 230 ; 327-333
2004-01-01
7 pages
Article (Journal)
English
DDC:
621.35
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