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    High Resolution Imaging by Means of Backscattered Electrons in the Scanning Electron Microscope

    New search for: Wandrol, P.
    New search for: Matejkova, J.
    New search for: Rek, A.
    New search for: Sandera, P.

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    High Resolution Imaging by Means of Backscattered Electrons in the Scanning Electron Microscope

    New search for: Wandrol, P.
    New search for: Matejkova, J.
    New search for: Rek, A.
    New search for: Sandera, P.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    High Resolution Imaging by Means of Backscattered Electrons in the Scanning Electron Microscope

    New search for: Wandrol, P.
    New search for: Matejkova, J.
    New search for: Rek, A.
    New search for: Sandera, P.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
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    Document information
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    Document information
    Title:

    High Resolution Imaging by Means of Backscattered Electrons in the Scanning Electron Microscope

    Contributors:

    Wandrol, P. (author) / Matejkova, J. (author) / Rek, A. (author) / Sandera, P.

    Published in:

    Materials Structure & Micromechanics of Fracture V ; 313-316

    MATERIALS SCIENCE FORUM ; 567/568

    Publication date:

    2008-01-01

    Size:

    4 pages

    ISSN:

    0255-5476

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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