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    Alternating corrent scanning electrochemical microscopy (AC-SECM) studies on the surface of electrochemically polished NiTi shape memory alloys

    New search for: Belgen, S.
    New search for: Schulte, A.
    New search for: Hessing, C.
    New search for: Pohl, M.
    New search for: Schuhmann, W.

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    Alternating corrent scanning electrochemical microscopy (AC-SECM) studies on the surface of electrochemically polished NiTi shape memory alloys

    New search for: Belgen, S.
    New search for: Schulte, A.
    New search for: Hessing, C.
    New search for: Pohl, M.
    New search for: Schuhmann, W.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Alternating corrent scanning electrochemical microscopy (AC-SECM) studies on the surface of electrochemically polished NiTi shape memory alloys

    New search for: Belgen, S.
    New search for: Schulte, A.
    New search for: Hessing, C.
    New search for: Pohl, M.
    New search for: Schuhmann, W.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

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    Document information
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    Document information
    Title:

    Alternating corrent scanning electrochemical microscopy (AC-SECM) studies on the surface of electrochemically polished NiTi shape memory alloys

    Contributors:

    Belgen, S. (author) / Schulte, A. (author) / Hessing, C. (author) / Pohl, M. (author) / Schuhmann, W. (author)

    Published in:

    MATERIALWISSENSCHAFT UND WERKSTOFFTECHNIK ; 35 ; 276-279

    Publication date:

    2004-01-01

    Size:

    4 pages

    ISSN:

    0933-5137

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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