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Alternating corrent scanning electrochemical microscopy (AC-SECM) studies on the surface of electrochemically polished NiTi shape memory alloys
Alternating corrent scanning electrochemical microscopy (AC-SECM) studies on the surface of electrochemically polished NiTi shape memory alloys
Alternating corrent scanning electrochemical microscopy (AC-SECM) studies on the surface of electrochemically polished NiTi shape memory alloys
Belgen, S. (author) / Schulte, A. (author) / Hessing, C. (author) / Pohl, M. (author) / Schuhmann, W. (author)
MATERIALWISSENSCHAFT UND WERKSTOFFTECHNIK ; 35 ; 276-279
2004-01-01
4 pages
Article (Journal)
English
DDC:
620.11
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