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    Residual Stress Measurement in Ion-Exchanged Glass by Iterated Birefringence and Etching-

    New search for: Abrams, M.
    New search for: Shen, J.
    New search for: Green, D.

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    Residual Stress Measurement in Ion-Exchanged Glass by Iterated Birefringence and Etching-

    New search for: Abrams, M.
    New search for: Shen, J.
    New search for: Green, D.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Residual Stress Measurement in Ion-Exchanged Glass by Iterated Birefringence and Etching-

    New search for: Abrams, M.
    New search for: Shen, J.
    New search for: Green, D.

    Access

    Access via TIB
    Check availability in my library
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    Document information
    Title:

    Residual Stress Measurement in Ion-Exchanged Glass by Iterated Birefringence and Etching-

    Contributors:

    Abrams, M. (author) / Shen, J. (author) / Green, D. (author)

    Published in:

    JOURNAL OF TESTING AND EVALUATION ; 32 ; 227-233

    Publication date:

    2004-01-01

    Size:

    7 pages

    ISSN:

    0090-3973

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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