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Measurement of Residual Stress in PDP Glass by Chemical Etching Method

Kim, J. H. / Choi, B. I. / Lee, H. J.

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Measurement of Residual Stress in PDP Glass by Chemical Etching Method

Kim, J. H. / Choi, B. I. / Lee, H. J.

Measurement of Residual Stress in PDP Glass by Chemical Etching Method

Kim, J. H. / Choi, B. I. / Lee, H. J.

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Access via TIB

Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

Measurement of Residual Stress in PDP Glass by Chemical Etching Method

Contributors:

Kim, J. H. (author) / Choi, B. I. (author) / Lee, H. J. (author) / Lee, S.-S. / Yoon, D.-J. / Lee, J.-H. / Lee, S.

Published in:

Advances in Nondestructive Evaluation Part 3 Proceedings of the 11^t^h Asian Pacific Conference on Nondestructive Testing, Jeju Island, Korea, 3-7 November 2003 ; 1779-1784

KEY ENGINEERING MATERIALS

Publication date:

2004-01-01

Size:

6 pages

ISSN:

1013-9826

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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