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    Ballistic Electron Emission Microscopy Study of p-Type 4H-SiC

    New search for: Ding, Y.
    New search for: Park, K. B.
    New search for: Pelz, J. P.
    New search for: Los, A. V.
    New search for: Mazzola, M. S.

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    Ballistic Electron Emission Microscopy Study of p-Type 4H-SiC

    New search for: Ding, Y.
    New search for: Park, K. B.
    New search for: Pelz, J. P.
    New search for: Los, A. V.
    New search for: Mazzola, M. S.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Ballistic Electron Emission Microscopy Study of p-Type 4H-SiC

    New search for: Ding, Y.
    New search for: Park, K. B.
    New search for: Pelz, J. P.
    New search for: Los, A. V.
    New search for: Mazzola, M. S.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Ballistic Electron Emission Microscopy Study of p-Type 4H-SiC

    Contributors:

    Ding, Y. (author) / Park, K. B. (author) / Pelz, J. P. (author) / Los, A. V. (author) / Mazzola, M. S. (author)

    Published in:

    MATERIALS SCIENCE FORUM ; 457/460 ; 1077-1080

    Publication date:

    2004-01-01

    Size:

    4 pages

    ISSN:

    0255-5476

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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