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Ballistic Electron Emission Microscopy Study of p-Type 4H-SiC
Ballistic Electron Emission Microscopy Study of p-Type 4H-SiC
Ballistic Electron Emission Microscopy Study of p-Type 4H-SiC
Ding, Y. (Autor:in) / Park, K. B. (Autor:in) / Pelz, J. P. (Autor:in) / Los, A. V. (Autor:in) / Mazzola, M. S. (Autor:in)
MATERIALS SCIENCE FORUM ; 457/460 ; 1077-1080
01.01.2004
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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