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    Structural Defects in SiC Crystals Investigated by High Energy X-Ray Diffraction

    New search for: Weisser, M.
    New search for: Seitz, C.
    New search for: Wellmann, P. J.
    New search for: Hock, R.
    New search for: Magerl, A.

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    Structural Defects in SiC Crystals Investigated by High Energy X-Ray Diffraction

    New search for: Weisser, M.
    New search for: Seitz, C.
    New search for: Wellmann, P. J.
    New search for: Hock, R.
    New search for: Magerl, A.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Structural Defects in SiC Crystals Investigated by High Energy X-Ray Diffraction

    New search for: Weisser, M.
    New search for: Seitz, C.
    New search for: Wellmann, P. J.
    New search for: Hock, R.
    New search for: Magerl, A.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

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    Check availability in my library
    Order at Subito €

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    Document information
    Similar titles

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    Document information
    Title:

    Structural Defects in SiC Crystals Investigated by High Energy X-Ray Diffraction

    Contributors:

    Weisser, M. (author) / Seitz, C. (author) / Wellmann, P. J. (author) / Hock, R. (author) / Magerl, A. (author)

    Published in:

    MATERIALS SCIENCE FORUM ; 457/460 ; 339-342

    Publication date:

    2004-01-01

    Size:

    4 pages

    ISSN:

    0255-5476

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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