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Numerical Modeling of Grain Boundary Effects in the Diffusional Creep of Copper Interconnect Lines
Numerical Modeling of Grain Boundary Effects in the Diffusional Creep of Copper Interconnect Lines
Numerical Modeling of Grain Boundary Effects in the Diffusional Creep of Copper Interconnect Lines
Grychanyuk, V. (author) / Tsukrov, I. (author) / Gross, T. (author)
INTERNATIONAL JOURNAL OF FRACTURE. ; 127 ; l149-l155
2004-01-01
l149-l155
Article (Journal)
English
DDC:
620.1126
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