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Numerical Modeling of Grain Boundary Effects in the Diffusional Creep of Copper Interconnect Lines
Numerical Modeling of Grain Boundary Effects in the Diffusional Creep of Copper Interconnect Lines
Numerical Modeling of Grain Boundary Effects in the Diffusional Creep of Copper Interconnect Lines
Grychanyuk, V. (Autor:in) / Tsukrov, I. (Autor:in) / Gross, T. (Autor:in)
INTERNATIONAL JOURNAL OF FRACTURE. ; 127 ; l149-l155
01.01.2004
l149-l155
Aufsatz (Zeitschrift)
Englisch
DDC:
620.1126
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