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    Copper-indium-gallium-diselenide/molybdenum layers analyzed by corrected SIMS depth profiles

    New search for: Bilger, G.
    New search for: Grabitz, P. O.
    New search for: Strohm, A.

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    Copper-indium-gallium-diselenide/molybdenum layers analyzed by corrected SIMS depth profiles

    New search for: Bilger, G.
    New search for: Grabitz, P. O.
    New search for: Strohm, A.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Copper-indium-gallium-diselenide/molybdenum layers analyzed by corrected SIMS depth profiles

    New search for: Bilger, G.
    New search for: Grabitz, P. O.
    New search for: Strohm, A.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Copper-indium-gallium-diselenide/molybdenum layers analyzed by corrected SIMS depth profiles

    Contributors:

    Bilger, G. (author) / Grabitz, P. O. (author) / Strohm, A. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 231/232 ; 804-807

    Publication date:

    2004-01-01

    Size:

    4 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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