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Matrix effects in SIMS depth profiles of SiGe relaxed buffer layers
Matrix effects in SIMS depth profiles of SiGe relaxed buffer layers
Matrix effects in SIMS depth profiles of SiGe relaxed buffer layers
Sanchez-Almazan, F. (author) / Napolitani, E. (author) / Carnera, A. (author) / Drigo, A. V. (author) / Isella, G. (author) / von Kanel, H. (author) / Berti, M. (author)
APPLIED SURFACE SCIENCE ; 231/232 ; 704-707
2004-01-01
4 pages
Article (Journal)
English
DDC:
621.35
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