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ToF-SIMS depth profiling of alumina scales formed on a FeCrAl high-temperature alloy
ToF-SIMS depth profiling of alumina scales formed on a FeCrAl high-temperature alloy
ToF-SIMS depth profiling of alumina scales formed on a FeCrAl high-temperature alloy
Engkvist, J. (author) / Bexell, U. (author) / Grehk, T. M. (author) / Olsson, M. (author)
APPLIED SURFACE SCIENCE ; 231/232 ; 850-853
2004-01-01
4 pages
Article (Journal)
English
DDC:
621.35
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