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    Evaluation of the nano-beam SIMS apparatus

    New search for: Nojima, M.
    New search for: Toi, M.
    New search for: Maekawa, A.
    New search for: Tomiyasu, B.
    New search for: Sakamoto, T.
    New search for: Owari, M.
    New search for: Nihei, Y.

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    Evaluation of the nano-beam SIMS apparatus

    New search for: Nojima, M.
    New search for: Toi, M.
    New search for: Maekawa, A.
    New search for: Tomiyasu, B.
    New search for: Sakamoto, T.
    New search for: Owari, M.
    New search for: Nihei, Y.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Evaluation of the nano-beam SIMS apparatus

    New search for: Nojima, M.
    New search for: Toi, M.
    New search for: Maekawa, A.
    New search for: Tomiyasu, B.
    New search for: Sakamoto, T.
    New search for: Owari, M.
    New search for: Nihei, Y.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
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    Document information
    Title:

    Evaluation of the nano-beam SIMS apparatus

    Contributors:

    Nojima, M. (author) / Toi, M. (author) / Maekawa, A. (author) / Tomiyasu, B. (author) / Sakamoto, T. (author) / Owari, M. (author) / Nihei, Y. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 231/232 ; 930-935

    Publication date:

    2004-01-01

    Size:

    6 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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