Fachinformationsdienst BAUdigital

A platform for research: civil engineering, architecture and urbanism

    Characterization of thin films on the nanometer scale by Auger electron spectroscopy and X-ray photoelectron spectroscopy

    New search for: Powell, C. J.
    New search for: Jablonski, A.
    New search for: Werner, W. S.
    New search for: Smekal, W.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Characterization of thin films on the nanometer scale by Auger electron spectroscopy and X-ray photoelectron spectroscopy

    New search for: Powell, C. J.
    New search for: Jablonski, A.
    New search for: Werner, W. S.
    New search for: Smekal, W.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Characterization of thin films on the nanometer scale by Auger electron spectroscopy and X-ray photoelectron spectroscopy

    New search for: Powell, C. J.
    New search for: Jablonski, A.
    New search for: Werner, W. S.
    New search for: Smekal, W.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Characterization of thin films on the nanometer scale by Auger electron spectroscopy and X-ray photoelectron spectroscopy

    Contributors:

    Powell, C. J. (author) / Jablonski, A. (author) / Werner, W. S. (author) / Smekal, W. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 239 ; 470-480

    Publication date:

    2005-01-01

    Size:

    11 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

    Similar titles

    Corrigendum to "Characterization of thin films on the nanometer scale by Auger electron spectroscopy and X-ray photoelectron spectroscopy"

    Powell, C. J. / Jablonski, A. / Werner, W. S. et al. | British Library Online Contents | 2005

    Auger electron and photoelectron spectroscopy of passivating films on thinplate

    Toshkovich, D. / Raikovich, M. B. | British Library Online Contents | 2003

    X-ray photoelectron spectroscopy and auger electron spectroscopy studies of Al-doped ZnO films

    Chen, M. / Wang, X. / Yu, Y. H. et al. | British Library Online Contents | 2000

    Reference data for Auger electron spectroscopy and X-ray photoelectron spectroscopy combined

    Seah, M.P. | British Library Online Contents | 1999

    Some Issues in Quantitative X-ray Photoelectron Spectroscopy and Auger-Electron Spectroscopy

    Powell, C. J. / Conny, J. M. / Jablonski, A. et al. | British Library Conference Proceedings | 2001

    Back to top