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A theoretical analysis of sensitivity in semiconductor measurement by microwave photoconductance decay
A theoretical analysis of sensitivity in semiconductor measurement by microwave photoconductance decay
A theoretical analysis of sensitivity in semiconductor measurement by microwave photoconductance decay
Chen, F. X. (author) / Cui, R. Q. (author) / Xu, L. (author)
MATERIALS SCIENCE AND ENGINEERING B -LAUSANNE- ; 116 ; 161-167
2005-01-01
7 pages
Article (Journal)
English
DDC:
620.11
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