Fachinformationsdienst BAUdigital

A platform for research: civil engineering, architecture and urbanism

    Recombination Lifetime in Silicon from Laser Microwave Photoconductance Decay Measurement

    New search for: Ling, C. H.
    New search for: Teoh, H. K.
    New search for: Choi, W. K.
    New search for: Zhou, T. Q.
    New search for: Brieger, M.
    New search for: Dittrich, H.
    New search for: Klose, M.
    New search for: Schock, H. W.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Recombination Lifetime in Silicon from Laser Microwave Photoconductance Decay Measurement

    New search for: Ling, C. H.
    New search for: Teoh, H. K.
    New search for: Choi, W. K.
    New search for: Zhou, T. Q.
    New search for: Brieger, M.
    New search for: Dittrich, H.
    New search for: Klose, M.
    New search for: Schock, H. W.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Recombination Lifetime in Silicon from Laser Microwave Photoconductance Decay Measurement

    New search for: Ling, C. H.
    New search for: Teoh, H. K.
    New search for: Choi, W. K.
    New search for: Zhou, T. Q.
    New search for: Brieger, M.
    New search for: Dittrich, H.
    New search for: Klose, M.
    New search for: Schock, H. W.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Recombination Lifetime in Silicon from Laser Microwave Photoconductance Decay Measurement

    Contributors:

    Ling, C. H. (author) / Teoh, H. K. (author) / Choi, W. K. (author) / Zhou, T. Q. (author) / Brieger, M. / Dittrich, H. / Klose, M. / Schock, H. W.

    Published in:

    Applications in Photovoltaics ; 255

    MATERIALS SCIENCE FORUM

    Publication date:

    1995-01-01

    Size:

    255 pages

    ISSN:

    0255-5476

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    Unknown

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

    Similar titles

    A theoretical analysis of sensitivity in semiconductor measurement by microwave photoconductance decay

    Chen, F. X. / Cui, R. Q. / Xu, L. | British Library Online Contents | 2005

    High Sensitivity Detection of Silicon Surface Reactions by Photoconductance Decay

    Norga, G. J. / Black, M. R. / Black, K. A. et al. | British Library Online Contents | 1995

    Recombination lifetime characterization and mapping of silicon wafers and detectors using the microwave photoconductivity decay (mPCD) technique

    Harkonen, J. / Tuovinen, E. / Li, Z. et al. | British Library Online Contents | 2006

    Lateral scanning of Si based systems by measurements of the microwave photoconductance

    Kunst, M. / Wunsch, F. / Jokisch, D. | British Library Online Contents | 2003

    The photoconductance of a single CdS nanoribbon

    Yingkai, L. / Xiangping, Z. / Dedong, H. et al. | British Library Online Contents | 2006

    Back to top