Fachinformationsdienst BAUdigital

A platform for research: civil engineering, architecture and urbanism

    Cross-sectional scanning tunneling microscopy observation of atomic arrangement in triple period-A type ordered AlInAs alloy

    New search for: Ohkouchi, S.
    New search for: Furuhashi, T.
    New search for: Gomyo, A.
    New search for: Makita, K.
    New search for: Suzuki, T.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Cross-sectional scanning tunneling microscopy observation of atomic arrangement in triple period-A type ordered AlInAs alloy

    New search for: Ohkouchi, S.
    New search for: Furuhashi, T.
    New search for: Gomyo, A.
    New search for: Makita, K.
    New search for: Suzuki, T.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Cross-sectional scanning tunneling microscopy observation of atomic arrangement in triple period-A type ordered AlInAs alloy

    New search for: Ohkouchi, S.
    New search for: Furuhashi, T.
    New search for: Gomyo, A.
    New search for: Makita, K.
    New search for: Suzuki, T.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Cross-sectional scanning tunneling microscopy observation of atomic arrangement in triple period-A type ordered AlInAs alloy

    Contributors:

    Ohkouchi, S. (author) / Furuhashi, T. (author) / Gomyo, A. (author) / Makita, K. (author) / Suzuki, T. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 241 ; 9-13

    Publication date:

    2005-01-01

    Size:

    5 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

    Similar titles

    Cross-Sectional Scanning Tunneling Microscopy of Semiconductor Heterostructures

    Yu, E. T. | British Library Online Contents | 1997

    Atomic Force Microscopy/Scanning Tunneling Microscopy

    Cohen, Samuel H. | TIBKAT | 1994

    Atomic Force Microscopy/Scanning Tunneling Microscopy 2

    Cohen, Samuel H. | TIBKAT | 1997

    Surface defects in semiconductor lasers studied with cross-sectional scanning tunneling microscopy

    Cobley, R. J. / Teng, K. S. / Brown, M. R. et al. | British Library Online Contents | 2010

    Scanning Tunneling Microscopy, Atomic Force Microscopy, and Related Techniques

    S. R. Snyder / H. S. White | NTIS | 1992

    Back to top