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    Surface defects in semiconductor lasers studied with cross-sectional scanning tunneling microscopy

    New search for: Cobley, R. J.
    New search for: Teng, K. S.
    New search for: Brown, M. R.
    New search for: Rees, P.
    New search for: Wilks, S. P.

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    Surface defects in semiconductor lasers studied with cross-sectional scanning tunneling microscopy

    New search for: Cobley, R. J.
    New search for: Teng, K. S.
    New search for: Brown, M. R.
    New search for: Rees, P.
    New search for: Wilks, S. P.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Surface defects in semiconductor lasers studied with cross-sectional scanning tunneling microscopy

    New search for: Cobley, R. J.
    New search for: Teng, K. S.
    New search for: Brown, M. R.
    New search for: Rees, P.
    New search for: Wilks, S. P.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Surface defects in semiconductor lasers studied with cross-sectional scanning tunneling microscopy

    Contributors:

    Cobley, R. J. (author) / Teng, K. S. (author) / Brown, M. R. (author) / Rees, P. (author) / Wilks, S. P. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 256 ; 5736-5739

    Publication date:

    2010-01-01

    Size:

    4 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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