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    TEM Studies of Grain Boundary Structure in a Cast Polycrystalline Silicon

    New search for: Kuchiwaki, I.
    New search for: Hirabayashi, T.
    New search for: Fukushima, H.

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    TEM Studies of Grain Boundary Structure in a Cast Polycrystalline Silicon

    New search for: Kuchiwaki, I.
    New search for: Hirabayashi, T.
    New search for: Fukushima, H.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    TEM Studies of Grain Boundary Structure in a Cast Polycrystalline Silicon

    New search for: Kuchiwaki, I.
    New search for: Hirabayashi, T.
    New search for: Fukushima, H.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

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    Document information
    Title:

    TEM Studies of Grain Boundary Structure in a Cast Polycrystalline Silicon

    Contributors:

    Kuchiwaki, I. (author) / Hirabayashi, T. (author) / Fukushima, H. (author)

    Published in:

    MATERIALS SCIENCE FORUM ; 475/479 ; 1673-1676

    Publication date:

    2005-01-01

    Size:

    4 pages

    ISSN:

    0255-5476

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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