Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
TEM Studies of Grain Boundary Structure in a Cast Polycrystalline Silicon
TEM Studies of Grain Boundary Structure in a Cast Polycrystalline Silicon
TEM Studies of Grain Boundary Structure in a Cast Polycrystalline Silicon
Kuchiwaki, I. (Autor:in) / Hirabayashi, T. (Autor:in) / Fukushima, H. (Autor:in)
MATERIALS SCIENCE FORUM ; 475/479 ; 1673-1676
01.01.2005
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Photoluminescence analysis of intra-grain defects in cast-grown polycrystalline silicon wafers
British Library Online Contents | 2006
|The five parameter grain boundary character distribution of polycrystalline silicon
British Library Online Contents | 2014
|British Library Online Contents | 2016
|British Library Online Contents | 2016
|British Library Online Contents | 2016
|