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    Observation of High-Aspect-Ratio Nanostructures Using Capillary Lithography

    New search for: Suh, K. Y.
    New search for: Choi, S.-J.
    New search for: Baek, S. J.
    New search for: Kim, T. W.
    New search for: Langer, R.

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    Observation of High-Aspect-Ratio Nanostructures Using Capillary Lithography

    New search for: Suh, K. Y.
    New search for: Choi, S.-J.
    New search for: Baek, S. J.
    New search for: Kim, T. W.
    New search for: Langer, R.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Observation of High-Aspect-Ratio Nanostructures Using Capillary Lithography

    New search for: Suh, K. Y.
    New search for: Choi, S.-J.
    New search for: Baek, S. J.
    New search for: Kim, T. W.
    New search for: Langer, R.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

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    Check availability in my library
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    Document information
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    Document information
    Title:

    Observation of High-Aspect-Ratio Nanostructures Using Capillary Lithography

    Contributors:

    Suh, K. Y. (author) / Choi, S.-J. (author) / Baek, S. J. (author) / Kim, T. W. (author) / Langer, R. (author)

    Published in:

    ADVANCED MATERIALS -DEERFIELD BEACH THEN WEINHEIM- ; 17 ; 560-564

    Publication date:

    2005-01-01

    Size:

    5 pages

    ISSN:

    0935-9648

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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