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    Measurements of Microscopic Stresses in Si-Based Polycrystalline Ceramics

    New search for: Pezzotti, G.
    New search for: Kim, H.-D.
    New search for: Lin, H.-T.
    New search for: Hoffmann, M. J.

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    Measurements of Microscopic Stresses in Si-Based Polycrystalline Ceramics

    New search for: Pezzotti, G.
    New search for: Kim, H.-D.
    New search for: Lin, H.-T.
    New search for: Hoffmann, M. J.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Measurements of Microscopic Stresses in Si-Based Polycrystalline Ceramics

    New search for: Pezzotti, G.
    New search for: Kim, H.-D.
    New search for: Lin, H.-T.
    New search for: Hoffmann, M. J.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

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    Check availability in my library
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    Document information
    Similar titles

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    Document information
    Title:

    Measurements of Microscopic Stresses in Si-Based Polycrystalline Ceramics

    Contributors:

    Pezzotti, G. (author) / Kim, H.-D. / Lin, H.-T. / Hoffmann, M. J.

    Published in:

    Advanced Si-Based Ceramics and Composites ; 438-448

    KEY ENGINEERING MATERIALS ; 287

    Publication date:

    2005-01-01

    Size:

    11 pages

    ISSN:

    1013-9826

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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