A platform for research: civil engineering, architecture and urbanism
Midgap Levels in As-Grown 4H-SiC Epilayers Investigated by DLTS
Midgap Levels in As-Grown 4H-SiC Epilayers Investigated by DLTS
Midgap Levels in As-Grown 4H-SiC Epilayers Investigated by DLTS
Danno, K. (author) / Kimoto, T. (author) / Matsunami, H. (author) / Nipoti, R. / Poggi, A. / Scorzoni, A.
2005-01-01
4 pages
Article (Journal)
English
DDC:
620.11
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Vacancies in As-Grown and Electron-Irradiated 4H-SiC Epilayers Investigated by Positron Annihilation
British Library Online Contents | 2003
|Study of hole traps in p-type ZnSe and ZnSSe epilayers by DLTS and admittance spectroscopy
British Library Online Contents | 1997
|Deep Hole Traps in As-Grown 4H-SiC Epilayers Investigated by Deep Level Transient Spectroscopy
British Library Online Contents | 2006
|Capacitance Spectroscopy Study of Midgap Levels in n-Type SiC Polytypes
British Library Online Contents | 2009
|DLTS characterisation of InGaAlP films grown using different V/III ratios
British Library Online Contents | 2001
|