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    Characterization of 4H-SiC PiN Diodes by Micro-Raman Scattering and Photoemission

    New search for: Thuaire, A.
    New search for: Mermoux, M.
    New search for: Crisci, A.
    New search for: Camara, N.
    New search for: Bano, E.
    New search for: Baillet, F.
    New search for: Pernot, E.
    New search for: Nipoti, R.
    New search for: Poggi, A.
    New search for: Scorzoni, A.

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    Characterization of 4H-SiC PiN Diodes by Micro-Raman Scattering and Photoemission

    New search for: Thuaire, A.
    New search for: Mermoux, M.
    New search for: Crisci, A.
    New search for: Camara, N.
    New search for: Bano, E.
    New search for: Baillet, F.
    New search for: Pernot, E.
    New search for: Nipoti, R.
    New search for: Poggi, A.
    New search for: Scorzoni, A.

    Access

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    Order at Subito €

    Characterization of 4H-SiC PiN Diodes by Micro-Raman Scattering and Photoemission

    New search for: Thuaire, A.
    New search for: Mermoux, M.
    New search for: Crisci, A.
    New search for: Camara, N.
    New search for: Bano, E.
    New search for: Baillet, F.
    New search for: Pernot, E.
    New search for: Nipoti, R.
    New search for: Poggi, A.
    New search for: Scorzoni, A.

    Access

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    Document information
    Title:

    Characterization of 4H-SiC PiN Diodes by Micro-Raman Scattering and Photoemission

    Contributors:

    Thuaire, A. (author) / Mermoux, M. (author) / Crisci, A. (author) / Camara, N. (author) / Bano, E. (author) / Baillet, F. (author) / Pernot, E. (author) / Nipoti, R. / Poggi, A. / Scorzoni, A.

    Published in:

    Silicon Carbide and Related Materials 2004 ; 437-440

    MATERIALS SCIENCE FORUM ; 483/485

    Publication date:

    2005-01-01

    Size:

    4 pages

    ISSN:

    0255-5476

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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