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Coupling between the Raman Spectroscopy and Photoemission Microscopy Techniques: Investigation of Defects in Biased 4H-SiC pin Diodes
Coupling between the Raman Spectroscopy and Photoemission Microscopy Techniques: Investigation of Defects in Biased 4H-SiC pin Diodes
Coupling between the Raman Spectroscopy and Photoemission Microscopy Techniques: Investigation of Defects in Biased 4H-SiC pin Diodes
Thuaire, A. (author) / Mermoux, M. (author) / Bano, E. (author) / Crisci, A. (author) / Baillet, F. (author) / Zekentes, K. (author) / Wright, N. / Johnson, C. M. / Vassilevski, K. / Nikitina, I.
2007-01-01
4 pages
Article (Journal)
English
DDC:
620.11
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